Getting disciplined about embedded software development: Part 2 - The Seven Step Plan
Here's a guide from Jack Ganssle on doing software development in a disciplined way to reduce both errors and the time it takes to complete a project. Part 2: The Seven Step Plan.
Oversampling with averaging to increase ADC resolution
How an MCU can extend the resolution/accuracy of an ADC by delivering an extra bit or two.
Point-of-Load: One for All
In this article we will examine a DC/DC controller in conjunction with the latest generation of NexFET power MOSFETs to address the higher efficiency aspect with additional functionality to increase the overall performance.
Fainting in Coils
Kendall Castor-Perry reckons that it is always good practice to match up your expectations to your resource and in this column he explains why it is particularly good idea when it comes to working with filters.
S-parameters Without Tears
Understand this increasingly critical measurement and its interpretations
How to efficiently use long record analysis to debug signals
Engineers need the ability to acquire and analyze very long time windows with 20 million points or more to identify the source of problems. Similarly long record capture and analysis is required in spread spectrum clocking (SSC) applications used to reduce EMI emissions.
JFET applications in today's analog world
Understand how this basic device fills a vital circuit function
Determining the packaging limits range of linear regulators
A typical linear regulator requires only a couple of external capacitors and resistors to fully implement a DC/DC converter, but the thermal characteristics of the packaging can impose limits on the operating envelope listed in the datasheet.
About the Industrial Control Industrial Instrumentation How-To Section Industrial Control DesignLine's Industrial Instrumentation Design Center section offers highly technical design articles on the development of industrial instrumentation systems and equipment. In particular, the section will look at the design issues involved in the development of data acquisition systems, industrial test/measurement equipment, PCI/PXI systems, and industrial monitoring systems/equipment.